Wide band (0.05–40 GHz) characterization and signal propagation in Cu–porous MSQ interconnects

Autor:	Wong, T.K.S., Kumar, R., Rustagi, S.C.
Zdroj:	In Microelectronic Engineering 2009 86(7):1918-1920
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect