Effect of deposition conditions on charging processes in SiN x: Application to RF-MEMS capacitive switches
Autor: | Daigler, Richard, Papandreou, Eleni, Koutsoureli, Matroni, Papaioannou, George, Papapolymerou, John |
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Zdroj: | In Microelectronic Engineering 2009 86(3):404-407 |
Databáze: | ScienceDirect |
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