Effect of deposition conditions on charging processes in SiN x: Application to RF-MEMS capacitive switches

Autor: Daigler, Richard, Papandreou, Eleni, Koutsoureli, Matroni, Papaioannou, George, Papapolymerou, John
Zdroj: In Microelectronic Engineering 2009 86(3):404-407
Databáze: ScienceDirect