Cracking energy estimation of ultra low- k package using novel prediction approach combined with global–local modeling technique
Autor: | Lee, Chang-Chun, Chou, Tsung-Lin, Chiu, Chien-Chia, Hsia, Chin-Chiu, Chiang, Kuo-Ning |
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Zdroj: | In Microelectronic Engineering 2008 85(10):2079-2084 |
Databáze: | ScienceDirect |
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