Cracking energy estimation of ultra low- k package using novel prediction approach combined with global–local modeling technique

Autor: Lee, Chang-Chun, Chou, Tsung-Lin, Chiu, Chien-Chia, Hsia, Chin-Chiu, Chiang, Kuo-Ning
Zdroj: In Microelectronic Engineering 2008 85(10):2079-2084
Databáze: ScienceDirect