Composition and electrical characteristics of Al 2O 3–HfO 2–HfTiO nanolaminates on Si
Autor: | Mikhelashvili, V., Lahav, A., Brener, R., Eisenstein, G. |
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Zdroj: | In Microelectronic Engineering 2008 85(7):1545-1548 |
Databáze: | ScienceDirect |
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