Measurement of the resonant frequency of nano-scale cantilevers by hard contact readout
Autor: | Dohn, S., Hansen, O., Boisen, A. |
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Zdroj: | In Microelectronic Engineering May-June 2008 85(5-6):1390-1394 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Dohn, S., Hansen, O., Boisen, A. |
---|---|
Zdroj: | In Microelectronic Engineering May-June 2008 85(5-6):1390-1394 |
Databáze: | ScienceDirect |
Externí odkaz: |