Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
| Autor: | Martens, K., Wang, W., De Keersmaecker, K., Borghs, G., Groeseneken, G., Maes, H. |
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| Zdroj: | In Microelectronic Engineering 2007 84(9):2146-2149 |
| Databáze: | ScienceDirect |
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