The passivation layer formation in the cryo-etching plasma process

Autor: Dussart, R., Mellhaoui, X., Tillocher, T., Lefaucheux, P., Boufnichel, M., Ranson, P.
Zdroj: In Microelectronic Engineering 2007 84(5):1128-1131
Databáze: ScienceDirect