Stochastic simulation studies of molecular resists

Autor: Drygiannakis, D., Patsis, G.P., Raptis, I., Niakoula, D., Vidali, V., Couladouros, E., Argitis, P., Gogolides, E.
Zdroj: In Microelectronic Engineering 2007 84(5):1062-1065
Databáze: ScienceDirect