Direct pattern transfer for sub-45 nm features using nanoimprint lithography

Autor: Le, Ngoc V., Dauksher, William J., Gehoski, Kathy A., Nordquist, Kevin J., Ainley, Eric, Mangat, Pawitter
Zdroj: In Microelectronic Engineering 2006 83(4):839-842
Databáze: ScienceDirect