On the profile of temperature dependent series resistance in Al/Si 3N 4/p-Si (MIS) Schottky diodes

Autor:	Bülbül, M.M., Zeyrek, S., Altındal, Ş., Yüzer, H.
Zdroj:	In Microelectronic Engineering 2006 83(3):577-581
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect