Adhesion improvement of ArF resist pattern depending on BARC material

Autor: Kawai, Akira, Moriuchi, Takahiro, Niiyama, Takayoshi, Kishioka, Takahiro, Maruyama, Daisuke, Sakaida, Yasushi, Matsumoto, Takashi
Zdroj: In Microelectronic Engineering 2006 83(4):659-662
Databáze: ScienceDirect