Low temperature spike anneal for Ni-silicide formation

Autor: Lauwers, A., Kittl, J.A., Van Dal, M., Chamirian, O., Lindsay, R., de Potter, M., Demeurisse, C., Vrancken, C., Maex, K., Pagès, X., Van der Jeugd, K., Kuznetsov, V., Granneman, E.
Zdroj: In Microelectronic Engineering October 2004 76(1-4):303-310
Databáze: ScienceDirect