Nature and location of interface traps in RF LDMOS due to hot carriers
| Autor: | Nigam, T., Shibib, A., Xu, S., Safar, H., Steinberg, L. |
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| Zdroj: | In Microelectronic Engineering 2004 72(1):71-75 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Nigam, T., Shibib, A., Xu, S., Safar, H., Steinberg, L. |
|---|---|
| Zdroj: | In Microelectronic Engineering 2004 72(1):71-75 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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