Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs
| Autor: | Felix, J.A., Schwank, J.R., Cirba, C.R., Schrimpf, R.D., Shaneyfelt, M.R., Fleetwood, D.M., Dodd, P.E. |
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| Zdroj: | In Microelectronic Engineering 2004 72(1):332-341 |
| Databáze: | ScienceDirect |
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