A compact DC model of gate oxide short defect
| Autor: | Bouchakour, R., Portal, J.M., Gallière, J.M., Azais, F., Bertrand, Y., Renovell, M. |
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| Zdroj: | In Microelectronic Engineering 2004 72(1):140-148 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Bouchakour, R., Portal, J.M., Gallière, J.M., Azais, F., Bertrand, Y., Renovell, M. |
|---|---|
| Zdroj: | In Microelectronic Engineering 2004 72(1):140-148 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect