Pt-based metallization of PMOS devices for a compatible monolithic integration of semiconducting/Yba 2Cu 3O 7− δ superconducting devices on silicon

Autor: Huot, G. *, Méchin, L., Bloyet, D.
Zdroj: In Microelectronic Engineering 2003 70(2):246-250
Databáze: ScienceDirect