Dependence of energy distributions of interface states on stress conditions
Autor: | Zhang, W.D., Zhang, J.F. ∗, Uren, M.J., Groeseneken, G., Degraeve, R., Lalor, M., Burton, D. |
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Zdroj: | In Microelectronic Engineering 2001 59(1):95-99 |
Databáze: | ScienceDirect |
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