A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
| Autor: | Saraza-Canflanca, P., Diaz-Fortuny, J., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F.V. |
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| Zdroj: | In Integration May 2020 72:13-20 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect