Reliability based hardware Trojan design using physics-based electromigration models
| Autor: | Cook, Chase, Sadiqbatcha, Sheriff, Sun, Zeyu, Tan, Sheldon X.-D. |
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| Zdroj: | In Integration May 2019 66:9-15 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Cook, Chase, Sadiqbatcha, Sheriff, Sun, Zeyu, Tan, Sheldon X.-D. |
|---|---|
| Zdroj: | In Integration May 2019 66:9-15 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect