Self-supervised assisted multi-task learning network for one-shot defect segmentation with fake defect generation
| Autor: | Hu, Ziqiang, Chu, Hao, Zhang, Yunzhou, Shan, Dexing, Shen, You |
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| Zdroj: | In Pattern Recognition Letters August 2024 184:89-96 |
| Databáze: | ScienceDirect |
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