Pronounced electromigration of GaInSn/Cu interconnects under super low critical current density
Autor: | Gao, Zhaoqing, Dong, Chong, Shang, Shengyan, Huang, Mingliang, Ma, Haitao, Wang, Yunpeng |
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Zdroj: | In Materials Letters 1 October 2021 300 |
Databáze: | ScienceDirect |
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