Pronounced electromigration of GaInSn/Cu interconnects under super low critical current density

Autor: Gao, Zhaoqing, Dong, Chong, Shang, Shengyan, Huang, Mingliang, Ma, Haitao, Wang, Yunpeng
Zdroj: In Materials Letters 1 October 2021 300
Databáze: ScienceDirect