Preparation and characterization of Er-doped AlN films by RF magnetron sputtering

Autor:	Hu, Xianwei, Tai, Zhiwei, Yang, Chengtao
Zdroj:	In Materials Letters 15 April 2018 217:281-283
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect