Structure analysis of boron-silicalite and of a “defect-free” MFI-silicalite by synchrotron radiation single crystal X-ray diffraction

Autor: Milanesio, M., Viterbo, D., Palin, L., Marra, G.L., Lamberti, C., Aiello, R., Testa, F.
Zdroj: In Studies in Surface Science and Catalysis 2002 142:1891-1898
Databáze: ScienceDirect