Scalable analytical model for reliability measures in aging VLSI by interacting Markovian agents
| Autor: | Cerotti, Davide, Miele, Antonio, Gribaudo, Marco, Bobbio, Andrea, Bolchini, Cristiana |
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| Zdroj: | In Performance Evaluation August 2019 132:21-37 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect