Unlocking inherent values of manufacturing metadata through digital characteristics (DC) alignment
| Autor: | Liu, Heli, Yang, Xiao, Weill, Maxim, Li, Shengzhe, Wu, Vincent, Politis, Denis J., Shi, Huifeng, Zhang, Zhichao, Wang, Liliang |
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| Zdroj: | In Computers in Industry December 2024 163 |
| Databáze: | ScienceDirect |
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