Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment
| Autor: | Luo, Qinyuan, Chang, Yuanhong, Chen, Jinglong, Jing, Hongjie, Lv, Haixin, Pan, Tongyang |
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| Zdroj: | In Computers in Industry December 2020 123 |
| Databáze: | ScienceDirect |
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