Val/Met BDNF as a genetic risk for a false sense of security in post-discharge suicide risk

Autor: Rufino, K.A., Goli, P., Patriquin, M.A., Kosten, T.R., Nielsen, D.A., Salas, R.
Zdroj: In Journal of Affective Disorders 1 June 2024 354:98-103
Databáze: ScienceDirect