Single-shot wavelength meter on a chip based on exponentially increasing delays and in-phase quadrature detection

Autor: Coggrave, C.R., Ruiz, P.D., Pallikarakis, C.A., Huntley, J.M., Du, H., Banakar, M., Yan, X., Tran, D.T., Littlejohns, C.G.
Zdroj: In Optics and Lasers in Engineering July 2024 178
Databáze: ScienceDirect