Single-shot wavelength meter on a chip based on exponentially increasing delays and in-phase quadrature detection
Autor: | Coggrave, C.R., Ruiz, P.D., Pallikarakis, C.A., Huntley, J.M., Du, H., Banakar, M., Yan, X., Tran, D.T., Littlejohns, C.G. |
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Zdroj: | In Optics and Lasers in Engineering July 2024 178 |
Databáze: | ScienceDirect |
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