Anti-noise light field depth measurement using specular highlight removal
| Autor: | Wu, Wei, Jin, Longxu, Qi, Biao, Li, Guoning, Li, Jin |
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| Zdroj: | In Optics and Lasers in Engineering May 2024 176 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Wu, Wei, Jin, Longxu, Qi, Biao, Li, Guoning, Li, Jin |
|---|---|
| Zdroj: | In Optics and Lasers in Engineering May 2024 176 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect