Anti-noise light field depth measurement using specular highlight removal
Autor: | Wu, Wei, Jin, Longxu, Qi, Biao, Li, Guoning, Li, Jin |
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Zdroj: | In Optics and Lasers in Engineering May 2024 176 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Wu, Wei, Jin, Longxu, Qi, Biao, Li, Guoning, Li, Jin |
---|---|
Zdroj: | In Optics and Lasers in Engineering May 2024 176 |
Databáze: | ScienceDirect |
Externí odkaz: |