Three-dimensional refractive index microscopy based on the multi-layer propagation model with obliquity factor correction

Autor: Tong, Zhan, Ren, Xuesong, Zhang, Zihan, Wang, Boyang, Miao, Yubin, Meng, Guoxiang
Zdroj: In Optics and Lasers in Engineering March 2024 174
Databáze: ScienceDirect