A nanomeasuring machine based white light tilt scanning interferometer for large scale optical array structure measurement

Autor: Guo, Tong, Ma, Long, Zhao, Jian, Dorantes-Gonzalez, Dante J., Fu, Xing, Hu, Xiaotang
Zdroj: In Optics and Lasers in Engineering 2011 49(9):1124-1130
Databáze: ScienceDirect