Inspection of nano-sized SNOM-tips by optical far-field evaluation
| Autor: | Seebacher, S., Osten, W. *, Veiko, V.P., Voznessenski, N.B. |
|---|---|
| Zdroj: | In Optics and Lasers in Engineering 2001 36(5):451-473 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Seebacher, S., Osten, W. *, Veiko, V.P., Voznessenski, N.B. |
|---|---|
| Zdroj: | In Optics and Lasers in Engineering 2001 36(5):451-473 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect