Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
| Autor: | Jürimägi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan |
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| Zdroj: | In Microprocessors and Microsystems September 2020 77 |
| Databáze: | ScienceDirect |
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