Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview

Autor: Vallero, A., Tselonis, S., Foutris, N., Kaliorakis, M., Kooli, M., Savino, A., Politano, G., Bosio, A., Di Natale, G., Gizopoulos, D., Di Carlo, S.
Zdroj: In Microprocessors and Microsystems November 2015 39(8):1204-1214
Databáze: ScienceDirect