A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices
| Autor: | Pfeifer, Petr, Pliva, Zdenek |
|---|---|
| Zdroj: | In Microprocessors and Microsystems August 2014 38(6):605-619 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect