Techniques for SAT-based constrained test pattern generation
| Autor: | Balcarek, Jiri, Fiser, Petr, Schmidt, Jan |
|---|---|
| Zdroj: | In Microprocessors and Microsystems March 2013 37(2):185-195 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Balcarek, Jiri, Fiser, Petr, Schmidt, Jan |
|---|---|
| Zdroj: | In Microprocessors and Microsystems March 2013 37(2):185-195 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect