Automated characterisation and analysis of large arrays of nanostructures fabricated at wafer scale

Autor: Llobet, J., Martins, M., Calaza, C., Antunes, M., Martins, S., Fonseca, H., Pires, B., Gaspar, J.
Zdroj: In Precision Engineering November 2019 60:320-325
Databáze: ScienceDirect