Automated characterisation and analysis of large arrays of nanostructures fabricated at wafer scale
Autor: | Llobet, J., Martins, M., Calaza, C., Antunes, M., Martins, S., Fonseca, H., Pires, B., Gaspar, J. |
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Zdroj: | In Precision Engineering November 2019 60:320-325 |
Databáze: | ScienceDirect |
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