Uncertainty analysis of point-by-point sampling complex surfaces using touch probe CMMs: DOE for complex surfaces verification with CMM
| Autor: | Barini, Emanuele Modesto, Tosello, Guido, De Chiffre, Leonardo |
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| Zdroj: | In Precision Engineering 2010 34(1):16-21 |
| Databáze: | ScienceDirect |
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