Intercomparison of scanning probe microscopes
Autor: | Breil, R, Fries, T, Garnaes, J, Haycocks, J, Hüser, D, Joergensen, J, Kautek, W, Koenders, L, Kofod, N, Koops, K.R, Korntner, R, Lindner, B, Mirandé, W, Neubauer, A, Peltonen, J, Picotto, G.B, Pisani, M, Rothe, H, Sahre, M, Stedman, M, Wilkening, G |
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Zdroj: | In Precision Engineering 2002 26(3):296-305 |
Databáze: | ScienceDirect |
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