Silicon wafer as a feasible candidate for tribological characterization of thin coatings under high contact stress?
| Autor: | Usman, Muhammad, Zhou, Zhifeng, Zia, Abdul Wasy, Li, Kwok Yan |
|---|---|
| Zdroj: | In Wear 15 July 2023 524-525 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect