Nano-scratch, nanoindentation and fretting tests of 5–80 nm ta-C films on Si(1 0 0)
| Autor: | Beake, B.D., Davies, M.I., Liskiewicz, T.W., Vishnyakov, V.M., Goodes, S.R. |
|---|---|
| Zdroj: | In Wear April-May 2013 301(1-2):575-582 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect