Microstructural characterization of the tool–chip interface enabled by focused ion beam and analytical electron microscopy
| Autor: | Flink, A., M'Saoubi, R., Giuliani, F., Sjölén, J., Larsson, T., Persson, P.O.Å., Johansson, M.P., Hultman, L. |
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| Zdroj: | In Wear 2009 266(11):1237-1240 |
| Databáze: | ScienceDirect |
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