Enhancing structural quality of high-resolution Siemens stars in X-ray optics through additional patterns

Autor: Chen, Qiucheng, Tong, Xujie, Wu, Qingxin, Quan, Hao, Zhu, Jingyuan, Liu, Jianpeng, Zhang, Sichao, Xie, Shanshan, Chen, Yifang
Zdroj: In Vacuum March 2025 233
Databáze: ScienceDirect