An extensive theoretical quantification of secondary electron emission from silicon
| Autor: | Khan, M.S.S., Mao, S.F., Zou, Y.B., Lu, D.B., Da, B., Li, Y.G., Ding, Z.J. |
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| Zdroj: | In Vacuum September 2023 215 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Khan, M.S.S., Mao, S.F., Zou, Y.B., Lu, D.B., Da, B., Li, Y.G., Ding, Z.J. |
|---|---|
| Zdroj: | In Vacuum September 2023 215 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect