Piezoresistive failure behaviors and mechanisms of the ITO thin films at high temperatures
| Autor: | Liu, Zhichun, Liang, Junsheng, Wang, Biling, Hou, Zhenqi, Wang, Haigang, Sun, Hongyi, Lu, Wenqi, Li, Qiang, Zhao, Xin, Xu, Jun, Wang, Dazhi |
|---|---|
| Zdroj: | In Vacuum September 2023 215 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect