Effects of seed layer thickness and post-annealing process on crystalline quality of β-Ga2O3 films prepared on Si (100) substrate by RF magnetron sputtering

Autor: Mi, Wei, Li, Xinwei, Ding, Yue, Wang, Di, Xu, Mingsheng, Xiao, Longfei, Zhang, Xingcheng, Chen, Xinrong, Li, Bingkun, Luo, Liyuan, Zhao, Jinshi, Zhou, Liwei, Yu, Junli
Zdroj: In Vacuum August 2023 214
Databáze: ScienceDirect