Optimization of the two parameters in the deconvolution procedure for obtaining the original in-depth distribution of composition from measured sputter depth profile by genetic algorithm

Autor: Wang, C.L., Li, J., Liu, X.X., Chen, Y.L., Tan, Z.H., Li, H.W., Yang, H., Lian, S.Y., Wang, J.Y., Xu, C.K.
Zdroj: In Vacuum February 2021 184
Databáze: ScienceDirect