Thickness measurement of low-Z films fabricated on thick substrate using EDXRF technique
| Autor: | Upmanyu, Arun Kumar, Kailash, Kapil, Ashutosh, Mehta, D., Kumar, Sanjeev |
|---|---|
| Zdroj: | In Vacuum January 2021 183 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Upmanyu, Arun Kumar, Kailash, Kapil, Ashutosh, Mehta, D., Kumar, Sanjeev |
|---|---|
| Zdroj: | In Vacuum January 2021 183 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect