Improved dielectric properties of La2O3–ZrO2 bilayer films for novel gate dielectrics
Autor: | Li, Shuan, Lin, Youyu, Li, Guoling, Yu, Hongen, Tang, Siyao, Wu, Yiman, Li, Xingguo, Tian, Wenhuai |
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Zdroj: | In Vacuum August 2020 178 |
Databáze: | ScienceDirect |
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